A Practical Approach to Single Event Transients Analysis for Highly Complex Designs
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Proc. of IEEE International Symposium on Defect and Fault Tolerance in VLSI & Nanotechnology Systems (DFT'11) |
| Author | Alexandrescu, D., Costenaro, E., Nicolaidis, M. |
| Maintainer | CCSD |
| Last Updated | May 28, 2026, 06:23 (UTC) |
| Created | May 28, 2026, 06:23 (UTC) |
| Identifier | hal-00671330 |
| Language | en |
| contributor | Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Vancouver, Canada |
| creator | Alexandrescu, D. |
| date | 2011-10-03T00:00:00 |
| harvest_object_id | 14122e0d-536e-4a92-b4b2-20593af20064 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/DFT.2011.18 |
| set_spec | type:COMM |