Proceedings of 18th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2007 (Special issue of Microelectronics Reliability, Vol. 47, Issues 9-11)
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | https://hal.science/hal-00670469 |
| Author | Labat, Nathalie, Touboul, Andre |
| Maintainer | CCSD |
| Last Updated | May 28, 2026, 14:22 (UTC) |
| Created | May 28, 2026, 14:22 (UTC) |
| Identifier | hal-00670469 |
| Language | en |
| contributor | Laboratoire de l'intégration, du matériau au système (IMS) ; Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS) |
| creator | Labat, Nathalie |
| date | 2007-09-03T00:00:00 |
| harvest_object_id | 4db0ef58-0e4d-4d32-a1a0-67c4059075c6 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-03-17T00:00:00 |
| set_spec | type:OUV |