Proceedings of 20th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2009 (Special issue of Microelectronics Reliability, Vol. 49, Issues 9-11)
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | https://hal.science/hal-00670468 |
| Author | Labat, Nathalie, Lewis, D. |
| Maintainer | CCSD |
| Last Updated | May 28, 2026, 14:43 (UTC) |
| Created | May 28, 2026, 14:43 (UTC) |
| Identifier | hal-00670468 |
| Language | en |
| contributor | Laboratoire de l'intégration, du matériau au système (IMS) ; Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS) |
| creator | Labat, Nathalie |
| date | 2009-09-01T00:00:00 |
| harvest_object_id | 9fe69e18-7099-4b46-91a7-f3e70aae2c92 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-03-17T00:00:00 |
| set_spec | type:OUV |