Thichkness measurement of non–transparent free films by means of a double–side white–light interferometer
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | 10th International Conference Metrology and properties of Engineering Surfaces |
| Author | Poilane, C., Sandoz, P. |
| Maintainer | CCSD |
| Last Updated | May 6, 2026, 05:33 (UTC) |
| Created | May 6, 2026, 05:33 (UTC) |
| Identifier | hal-00095257 |
| Language | en |
| contributor | Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174) (FEMTO-ST) ; Université de Technologie de Belfort-Montbeliard (UTBM)-Ecole Nationale Supérieure de Mécanique et des Microtechniques (ENSMM)-Centre National de la Recherche Scientifique (CNRS)-Université de Franche-Comté (UFC) ; Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC) |
| creator | Poilane, C. |
| date | 2005-05-06T00:00:00 |
| harvest_object_id | bdbb5b0e-1df3-4afd-ab1d-40532f93ed03 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-02-18T00:00:00 |
| set_spec | type:COMM |