From Microelectronics to Integrated Microsystems Testing
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Microsystems Technology – Fabrication, test and reliability |
| Author | Mir, Salvador, Charlot, B. |
| Maintainer | CCSD |
| Last Updated | May 9, 2026, 14:18 (UTC) |
| Created | May 9, 2026, 14:18 (UTC) |
| Identifier | hal-00086664 |
| Language | en |
| contributor | Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Mir, Salvador |
| date | 2003-05-09T00:00:00 |
| harvest_object_id | 3fb02712-f0aa-4a74-8035-96605d852b75 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| set_spec | type:COUV |