Finite element modelling of stacked thin regions with non-zero global currents

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Source ISSN: 0332-1649
Author Dular, Patrick, Gyselinck, Johan, Zeidan, Tarek, Krähenbühl, Laurent
Maintainer CCSD
Last Updated May 10, 2026, 22:44 (UTC)
Created May 10, 2026, 22:44 (UTC)
Identifier hal-00082830
Language en
contributor Department of Electrical Engineering and Computer Science (Institut Montefiore) ; Université de Liège = University of Liège = Universiteit van Luik = Universität Lüttich (ULiège)
creator Dular, Patrick
date 2004-05-10T00:00:00
harvest_object_id f9f50b7c-f58b-4f3b-8d96-f0b20ee74b4a
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-03-10T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1108/03321640410540638
set_spec type:ART