Asynchronous circuits transient faults sensitivity evaluation
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Annual ACM IEEE Design Automation Conference, Proceedings of the 42nd annual conference on Design automation |
| Author | Monnet, Y., Renaudin, Marc, Leveugle, Régis |
| Maintainer | CCSD |
| Last Updated | May 13, 2026, 11:51 (UTC) |
| Created | May 13, 2026, 11:51 (UTC) |
| Identifier | hal-00079753 |
| Language | en |
| contributor | Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | San Diego, California,, United States |
| creator | Monnet, Y. |
| date | 2005-05-13T00:00:00 |
| harvest_object_id | 837ccf4f-a892-4fb6-b13f-bf4abdd494ae |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1145/1065579.1065805 |
| set_spec | type:COMM |