Charge transport in l-DNA probed by conducting-AFM, and relationship with its structure

We studied the electrical conductivity of DNA samples as function of the number of DNA molecules. We showed that the insulating gap (no current at low voltage) increases from ~1-2 V for bundles and large ropes to ~4-7 V for few DNA molecules. From the distance dependent variation of the current, a unique hopping distance of ~3 nm is calculated (polaron-hopping model) independently of the number of DNA in the sample. The highly resistive behavior of the single DNA is correlated with its flattened conformation on the surface (reduced thickness, ~0.5-1.5 nm, compared to its nominal value, ~2 nm).

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Source https://hal.science/hal-00000703
Author Heim, Thomas, Deresmes, D., Vuillaume, Dominique
Maintainer CCSD
Last Updated May 16, 2026, 11:38 (UTC)
Created May 16, 2026, 11:38 (UTC)
Identifier hal-00000703
Language en
Rights https://about.hal.science/hal-authorisation-v1/
contributor Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN) ; Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)
creator Heim, Thomas
date 2003-10-10T00:00:00
harvest_object_id a74613fb-4e7b-4c31-9566-3579e7debd82
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2024-01-24T00:00:00
relation info:eu-repo/semantics/altIdentifier/arxiv/cond-mat/0310242
set_spec type:UNDEFINED