Electromagnetic fault injection: towards a fault model on a 32-bit microcontroller
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Proceedings of the 10th workshop on Fault Diagnosis and Tolerance in Cryptography |
| Author | Moro, Nicolas, Dehbaoui, Amine, Heydemann, Karine, Robisson, Bruno, Encrenaz, Emmanuelle |
| Maintainer | CCSD |
| Last Updated | May 6, 2026, 05:59 (UTC) |
| Created | May 6, 2026, 05:59 (UTC) |
| Identifier | emse-00871218 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Département Systèmes et Architectures Sécurisés (SAS-ENSMSE) ; École des Mines de Saint-Étienne (Mines Saint-Étienne MSE) ; Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT)-CMP-GC |
| coverage | Santa-Barbara, United States |
| creator | Moro, Nicolas |
| date | 2013-08-20T00:00:00 |
| harvest_object_id | 43b0b5fc-4b40-440c-ad71-d40eb0395f80 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-02-07T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/arxiv/1402.6421 |
| set_spec | type:COMM |