A Data Mining Approach for Yield Loss' causes Identification in Semi-conductor Industry
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ENBIS-13 Summary Session Reports |
| Author | Barkia, Hasna, Boucher, Xavier |
| Maintainer | CCSD |
| Last Updated | May 10, 2026, 06:18 (UTC) |
| Created | May 10, 2026, 06:18 (UTC) |
| Identifier | emse-00847375 |
| Language | en |
| contributor | Département Performance Industrielle et Environnementale des Systèmes et des Organisations (PIESO-ENSMSE) ; École des Mines de Saint-Étienne (Mines Saint-Étienne MSE) ; Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT)-Institut Henri Fayol |
| coverage | Londres, United Kingdom |
| creator | Barkia, Hasna |
| date | 2013-09-15T00:00:00 |
| harvest_object_id | e666c7aa-0a60-45a0-970a-77cfceae9bb6 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-04-23T00:00:00 |
| set_spec | type:COMM |