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Quantitative study of microtwins in GaP/Si thin film and GaAsPN quantum wells...
original title in MBE 2012 : "Structural and optical studies of GaP/Si induced defects in GaAsPN quantum wells grown on Si" -
Synchrotron X-ray diffraction analysis for quantitative defect evaluation in ...
original title in E-MRS Spring 2012 - Symposium W : "Synchrotron X-ray diffraction complementary peak analysis for quantitative defect evaluation in GaP/Si nanolayers"
