@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-tel-00998831v1> a dcat:Dataset ;
    dct:description """
              VLSI ("Very Large Scale Integration") technologies are part of our daily life and miniaturization needs are increasing. The densification of transistors not only means having trouble locating the so-called "hard defects" occurring during the development phases (debug) or aging, but also the appearance of pure non-functional behaviors related to component design flaws. Techniques discussed in this document are intended to probe microelectronic circuits using a tool called dynamic light emission (Time Resolved Imaging - TRI) in search of abnormal behavior in terms of timings and patterns involved in structures. To go further, this instrument also allows viewing thermographic time resolved thermal transients within a component.
            """ ;
    dct:identifier "tel-00998831" ;
    dct:issued "2026-05-05T09:51:42.933765"^^xsd:dateTime ;
    dct:language "fr" ;
    dct:modified "2026-05-05T09:51:42.933769"^^xsd:dateTime ;
    dct:publisher <https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> ;
    dct:title "Applications de la cartographie en émission de lumière dynamique (Time Resolved Imaging) pour l'analyse de défaillance des composants VLSI" ;
    dcat:contactPoint [ a vcard:Organization ;
            vcard:fn "CCSD" ] ;
    dcat:distribution <https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-tel-00998831v1/resource/19063f51-c81f-431b-b53b-fbc1cd1655e8> ;
    dcat:keyword "analyse-de-defaillance-microelectronique",
        "cartographie-en-emission-de-lumiere-dynamique",
        "detection-de-photons-en-temps-resolu",
        "infoeu-reposemanticsdoctoralthesis",
        "spitronengineering-sciences-physicselectronics",
        "theses" ;
    dcat:landingPage <https://theses.hal.science/tel-00998831> .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-tel-00998831v1/resource/19063f51-c81f-431b-b53b-fbc1cd1655e8> a dcat:Distribution ;
    dct:format "HTML" ;
    dct:issued "2026-05-05T09:51:42.936170"^^xsd:dateTime ;
    dct:modified "2026-05-05T09:51:42.925023"^^xsd:dateTime ;
    dct:title "Applications de la cartographie en émission de lumière dynamique (Time Resolved Imaging) pour l'analyse de défaillance des composants VLSI" ;
    dcat:accessURL <https://theses.hal.science/tel-00998831> .

<https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> a foaf:Agent ;
    foaf:name "test_moissonnage_selune" .

<https://theses.hal.science/tel-00998831> a foaf:Document .