Electronics instrumentations for the following ageing process and the diagnostic failure of the power semiconductor device
type: Dataset
contact point: Organization
  fn: CCSD
keyword: universal-impedance-diagram
keyword: metallisation
keyword: courant-de-foucault
keyword: distribution-de-tension
keyword: diagramme-de-limpedance-normalisee
keyword: metallization
keyword: eddy-current
keyword: mesh-free-modeling-method
keyword: modules-de-puissance-a-semi-conducteur
keyword: distribution-de-courant
keyword: potential-distribution
keyword: ageing
keyword: current-distribution
keyword: inverse-problem
keyword: probleme-inverse
keyword: theses
keyword: spiotherengineering-sciences-physicsother
keyword: infoeu-reposemanticsdoctoralthesis
keyword: vieillissement
keyword: hall-sensor
keyword: effet-hall
keyword: modele-semi-analytique
keyword: power-semiconductor-device
keyword: diagnostic
landing page: https://theses.hal.science/tel-00910357
description: This thesis is dedicated to develop electronic instrumentation systems that allow to analyse the ageing process and to make a diagnosis the failure mechanisms of power semiconductor device. The research objectives were to evaluate the electrical conductivity variation of metallization layer using the eddy current technique but also to estimate the ageing effect of the semiconductor dies and their module packaging on the current distribution in the die, to better understand the mechanism failures. The specimens simplified and the power semiconductor modules were aged by thermal cycles. The various sensors have been used (eddy current sensor, Hall sensor), to follow the ageing process, and to understand the ageing effect on the power semiconductor die. The experimental instrumentation system has been developed and used, to realize the non destructive evaluation by the eddy current technique on the metallization layer and to measure the map of magnetic field induced above the die by the magnetic sensor, the potential distribution. In the first time, this system allowed to evaluate the relevance and the performance of different type sensors used for the local measure on the electrical conductivity by eddy current sensors and on the currents distribution by Hall sensors or the potential distribution of the source metallization layer. This work was also supported by the signal processing techniques. To estimate quantitatively the electrical conductivity of metallization layer by the eddy current sensors, a model using the two-winding transformer analogy simulate the electromagnetic interaction between the sensor and the conducting plate. And, the current distribution from the measured data is given by inverting a mesh-free modeling of the induced magnetic field. The results obtained from these models can allow us to firstly understand certain failure mechanisms, but also to propose the integrated circuit with the sensors for monitoring "in situ" the state ageing of power …
identifier: NNT: 2013DENS0018
issued: 2026-05-08T01:40:45.879417
language: fr
modified: 2026-05-08T01:40:45.879422

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type: Agent

Electronics instrumentations for the following ageing process and the diagnostic failure of the power semiconductor device
type: Distribution
access URL: https://theses.hal.science/tel-00910357
format: HTML
issued: 2026-05-08T01:40:45.946715
modified: 2026-05-08T01:40:45.845955