The thesis objective is to study the Magnetic Tunnel Junction reliability and cyclability to more understand the barrier breakdown mechanisms. An investigation of barrier endurance till electrical breakdown in MgO-based magnetic tunnel junctions (MTJs) is presented. Samples were tested under pulsed electrical stress. By studying the effect of delay between successive pulses, an optimum endurance of MTJs is observed for an intermediate value of delay between pulses corresponding to an optimum trade-off between the average density of charge trapped in the barrier and the amplitude of its time-modulation at each voltage pulse. Furthermore, a charge trapping/detrapping model was developed which support this interpretation. The study emphasizes the role of electron trapping/detrapping mechanisms on the tunnel barrier reliability. It also shows that extremely long endurance could be obtained in MTJs by reducing the density of electron trapping sites in the tunnel barrier. Then the write endurance and the 1/f noise of electrical origin were characterized in CoFeB/MgO/CoFeB MTJ for STT-MRAM or TA-MRAM. A correlation was observed and explained by the presence of electron trapping sites in the MgO barrier and the role of electron trapping/detrapping phenomena in both the MTJ reliability and its 1/f electrical noise power. These results suggest that 1/f noise could be used as a predictive characterization of the MTJ endurance. Finally, as thesis perspectives, some complement measurements were proposed to further investigate this model and an optimization of MgO barrier which could be carried out to reduce the density of these trapping sites was presented to ameliorate the MTJs reliability.