Development of a metrological atomic force microscope
URL: https://theses.hal.science/tel-00830895
Dataset description:
Scanning probe microscopes are very well used for characterization at the nanometer scale. To ensure the measurement coherency and the accuracy of the results, those microscopes...
Source: Development of a metrological atomic force microscope
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Additional Information
| Field | Value |
|---|---|
| Data last updated | unknown |
| Metadata last updated | May 10, 2026 |
| Created | unknown |
| Format | HTML |
| License | https://about.hal.science/hal-authorisation-v1/, info:eu-repo/semantics/OpenAccess |
| Created | 5 months ago |
| Id | e4308415-2fad-4dd4-b890-26466ae76eb5 |
| Package id | oai-hal-tel-00830895v1 |
| Resource type | HTML |
| State | active |
