Numerical study of electro-thermal effects in...
URL: https://theses.hal.science/tel-00827633
Dataset description:
The ultra-short gate (LG < 20 nm) CMOS components (Complementary Metal-Oxide-Semiconductor) face thermal limitations due to significant local heating induced by phonon...
Source: Numerical study of electro-thermal effects in silicon devices
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Additional Information
| Field | Value |
|---|---|
| Data last updated | unknown |
| Metadata last updated | May 10, 2026 |
| Created | unknown |
| Format | HTML |
| License | https://about.hal.science/hal-authorisation-v1/, info:eu-repo/semantics/OpenAccess |
| Created | 5 months ago |
| Id | 268c7b83-f857-4cac-97c8-332b3fd3bbfe |
| Package id | oai-hal-tel-00827633v1 |
| Resource type | HTML |
| State | active |
