@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-tel-00767284v2> a dcat:Dataset ;
    dct:description """
              Electrical and physical properties of low-dimensional structures have been studied for the various applications such as electronics, sensors, and etc. Low-frequency noise measurement is also a useful technique to give more information for the carrier dynamics correlated to the oxide traps, channel defects, and scattering. In this thesis, the electrical transport and low-frequency noise of low-dimensional structure devices such as multi-gate structures (e.g. FinFETs and Junctionless FETs), 3-D stacked Si/SiGe nanowire FETs, carbon nanotubes, and graphene are presented. From the view point of top-down and bottom-up approaches, the impacts of LF noise are investigated according to the dimensionality, conduction mechanism (surface or volume conduction), strain technique, and metal-semiconductor junctions.
            """ ;
    dct:identifier "NNT: 2011GRENT096" ;
    dct:issued "2026-05-30T02:42:21.981366"^^xsd:dateTime ;
    dct:language "fr" ;
    dct:modified "2026-05-30T02:42:21.981382"^^xsd:dateTime ;
    dct:publisher <https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> ;
    dct:title "Transport properties and low-frequency noise in low-dimensional structures" ;
    dcat:contactPoint [ a vcard:Organization ;
            vcard:fn "CCSD" ] ;
    dcat:distribution <https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-tel-00767284v2/resource/fb319f86-b630-4c9d-ac89-d85521efc9c1> ;
    dcat:keyword "bruit-a-basse-frequence",
        "caracterisation-electrique",
        "cnt",
        "electrical-characterization",
        "electrical-transport",
        "extraction-de-parametres",
        "finfet",
        "graphene",
        "infoeu-reposemanticsdoctoralthesis",
        "junctionless-fet",
        "low-frequency-noise",
        "modeling",
        "modelisation",
        "nanofils",
        "parameter-extraction",
        "simulation",
        "spiotherengineering-sciences-physicsother",
        "theses",
        "transistor-fet-sans-jonction",
        "transistors",
        "transport-electrique" ;
    dcat:landingPage <https://theses.hal.science/tel-00767284> .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-tel-00767284v2/resource/fb319f86-b630-4c9d-ac89-d85521efc9c1> a dcat:Distribution ;
    dct:format "HTML" ;
    dct:issued "2026-05-30T02:42:22.073993"^^xsd:dateTime ;
    dct:modified "2026-05-30T02:42:21.867818"^^xsd:dateTime ;
    dct:title "Transport properties and low-frequency noise in low-dimensional structures" ;
    dcat:accessURL <https://theses.hal.science/tel-00767284> .

<https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> a foaf:Agent ;
    foaf:name "test_moissonnage_selune" .

<https://theses.hal.science/tel-00767284> a foaf:Document .