@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-lirmm-00805123v1> a dcat:Dataset ;
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    dct:identifier "lirmm-00805123" ;
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    dct:language "en" ;
    dct:modified "2026-05-12T02:26:51.581966"^^xsd:dateTime ;
    dct:publisher <https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> ;
    dct:title "Failure Analysis and Test Solutions for Low-Power SRAMs" ;
    dcat:contactPoint [ a vcard:Organization ;
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        "infoeu-reposemanticsconferenceobject",
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        "memory-test",
        "power-switch",
        "spitronengineering-sciences-physicselectronics",
        "sram" ;
    dcat:landingPage <20th%20IEEE%20Asian%20Test%20Symposium> .

<20th%20IEEE%20Asian%20Test%20Symposium> a foaf:Document .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-lirmm-00805123v1/resource/a66e35c9-2441-4e15-812f-bcba6f8aaf55> a dcat:Distribution ;
    dct:format "HTML" ;
    dct:issued "2026-05-12T02:26:51.635331"^^xsd:dateTime ;
    dct:modified "2026-05-12T02:26:51.561752"^^xsd:dateTime ;
    dct:title "Failure Analysis and Test Solutions for Low-Power SRAMs" ;
    dcat:accessURL <https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805123> .

<https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> a foaf:Agent ;
    foaf:name "test_moissonnage_selune" .