Low temperature transport spectroscopy of defects using Schottky-barrier MOSFETs
type: Distribution
access URL: https://in2p3.hal.science/in2p3-00683377
format: HTML
issued: 2026-05-23T06:47:48.214749
modified: 2026-05-23T06:47:48.174551

test_moissonnage_selune
type: Agent

Low temperature transport spectroscopy of defects using Schottky-barrier MOSFETs
type: Dataset
contact point: Organization
  fn: CCSD
keyword: physcondcm-msphysics-physicscondensed-matter-cond-matmaterials-science-cond-matmtrl-sci
keyword: journal-articles
keyword: single-defects
keyword: infoeu-reposemanticsarticle
keyword: spectroscopy
keyword: electron-transport
landing page: 0921-4526
description: International audience
issued: 2026-05-23T06:47:48.192565
language: en
modified: 2026-05-23T06:47:48.192570