Analyse électrique des courants de fuite de HEMTs AlGaN/GaN sur SiC
type: Distribution
access URL: https://hal.science/hal-00987763
format: HTML
issued: 2026-05-05T12:01:18.102229
modified: 2026-05-05T12:01:18.094506

test_moissonnage_selune
type: Agent

Analyse électrique des courants de fuite de HEMTs AlGaN/GaN sur SiC
type: Dataset
contact point: Organization
  fn: CCSD
keyword: spitronengineering-sciences-physicselectronics
keyword: infoeu-reposemanticsconferenceobject
keyword: conference-papers
landing page: Actes des JNM 2013
description: International audience
issued: 2026-05-05T12:01:18.099621
language: fr
modified: 2026-05-05T12:01:18.099626