Electro-Thermal Investigation and Modeling of Sige Hbt High-Speed Devices
type: Dataset
contact point: Organization
  fn: CCSD
keyword: infoeu-reposemanticsconferenceobject
keyword: conference-papers
keyword: spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics
landing page: Materials, Processing and Devices
description: International audience
issued: 2026-05-05T12:08:17.441477
language: en
modified: 2026-05-05T12:08:17.441481

test_moissonnage_selune
type: Agent

Electro-Thermal Investigation and Modeling of Sige Hbt High-Speed Devices
type: Distribution
access URL: https://hal.science/hal-00987211
format: HTML
issued: 2026-05-05T12:08:17.442921
modified: 2026-05-05T12:08:17.435752