Security Vulnerabilities Test Generation from SysML and Event-B models for EMV cards
type: Dataset
description: International audience
issued: 2026-05-05T13:46:09.416122
language: en
modified: 2026-05-05T13:46:09.416127
contact point: Organization
  fn: CCSD
keyword: emv
keyword: event-b
keyword: infoeu-reposemanticsarticle
keyword: infoinfo-crcomputer-science-cscryptography-and-security-cscr
keyword: infoinfo-mocomputer-science-csmodeling-and-simulation
keyword: infoinfo-secomputer-science-cssoftware-engineering-csse
keyword: journal-articles
keyword: model-based-testing
keyword: smart-card
keyword: sysml
keyword: vulnerability
landing page: International Journal of Security and Its Applications

Security Vulnerabilities Test Generation from SysML and Event-B models for EMV cards
type: Distribution
format: HTML
issued: 2026-05-05T13:46:09.422652
modified: 2026-05-05T13:46:09.398240
access URL: https://unilim.hal.science/hal-00981692

test_moissonnage_selune
type: Agent