Interferometric technique for scanning near-field microwave microscopy applications
type: Dataset
description: An interferometric technique for scanning near-field microscopy applications is proposed. The method is based on the association of a vector network analyzer, an evanescent microwave coaxial probe and a precise interferometer built up with a power divider, a phase-shifter, and an attenuator. Advantages, such as simplicity of operation, broad frequency band capabilities and high measurement sensitivity are achieved. In particular, a scanning near-field microwave microscope is built and experiments related to the measurement sensitivity in the frequency range 2-6 GHz are demonstrated. A lumped element model is also performed to represent the interaction between the probe and sample. A one port calibration model is developed to retrieve the reflection coefficient and then the electromagnetics properties of the sample.
issued: 2026-05-05T14:19:42.088202
language: en
modified: 2026-05-05T14:19:42.088207
contact point: Organization
  fn: CCSD
keyword: infoeu-reposemanticsarticle
keyword: interferometry
keyword: journal-articles
keyword: near-field-scanning-microwave-microscopy
keyword: nondestructive-testing-and-evaluation
landing page: 0018-9456

Interferometric technique for scanning near-field microwave microscopy applications
type: Distribution
format: HTML
issued: 2026-05-05T14:19:42.092480
modified: 2026-05-05T14:19:42.078119
access URL: https://hal.science/hal-00980043

test_moissonnage_selune
type: Agent