@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00980043v1> a dcat:Dataset ;
    dct:description """
              An interferometric technique for scanning near-field microscopy applications is proposed. The method is based on the association of a vector network analyzer, an evanescent microwave coaxial probe and a precise interferometer built up with a power divider, a phase-shifter, and an attenuator. Advantages, such as simplicity of operation, broad frequency band capabilities and high measurement sensitivity are achieved. In particular, a scanning near-field microwave microscope is built and experiments related to the measurement sensitivity in the frequency range 2-6 GHz are demonstrated. A lumped element model is also performed to represent the interaction between the probe and sample. A one port calibration model is developed to retrieve the reflection coefficient and then the electromagnetics properties of the sample.
            """ ;
    dct:identifier "hal-00980043" ;
    dct:issued "2026-05-05T14:19:42.088202"^^xsd:dateTime ;
    dct:language "en" ;
    dct:modified "2026-05-05T14:19:42.088207"^^xsd:dateTime ;
    dct:publisher <https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> ;
    dct:title "Interferometric technique for scanning near-field microwave microscopy applications" ;
    dcat:contactPoint [ a vcard:Organization ;
            vcard:fn "CCSD" ] ;
    dcat:distribution <https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00980043v1/resource/d4ac3729-5c40-43d0-a178-8a813f26cef7> ;
    dcat:keyword "infoeu-reposemanticsarticle",
        "interferometry",
        "journal-articles",
        "near-field-scanning-microwave-microscopy",
        "nondestructive-testing-and-evaluation" ;
    dcat:landingPage <ISSN:%200018-9456> .

<ISSN:%200018-9456> a foaf:Document .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00980043v1/resource/d4ac3729-5c40-43d0-a178-8a813f26cef7> a dcat:Distribution ;
    dct:format "HTML" ;
    dct:issued "2026-05-05T14:19:42.092480"^^xsd:dateTime ;
    dct:modified "2026-05-05T14:19:42.078119"^^xsd:dateTime ;
    dct:title "Interferometric technique for scanning near-field microwave microscopy applications" ;
    dcat:accessURL <https://hal.science/hal-00980043> .

<https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> a foaf:Agent ;
    foaf:name "test_moissonnage_selune" .

