Electrical characterization of semiconductor...
URL: https://hal.science/hal-00974539
Dataset description:
In order to understand the structural and electronic properties of semiconductor nanowires, scanning tunneling microscopy is an appealing technique that can supplement...
Source: Electrical characterization of semiconductor nanowires by scanning tunneling microscopy
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Additional Information
| Field | Value |
|---|---|
| Data last updated | unknown |
| Metadata last updated | May 5, 2026 |
| Created | unknown |
| Format | HTML |
| License | No License Provided |
| Created | 6 months ago |
| Id | c7864add-088f-4b57-9b8a-f5b03cdabf57 |
| Package id | oai-hal-hal-00974539v1 |
| Resource type | HTML |
| State | active |