ADCs Dynamic Testing by Multiharmonic Sine Fitting Algorithms
type: Dataset
description: International audience
issued: 2026-05-06T02:30:32.720782
language: en
modified: 2026-05-06T02:30:32.720786
contact point: Organization
  fn: CCSD
keyword: conference-papers
keyword: infoeu-reposemanticsconferenceobject
keyword: spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics
landing page: 20
landing page: 202011
landing page: 2
landing page: 2011

ADCs Dynamic Testing by Multiharmonic Sine Fitting Algorithms
type: Distribution
format: HTML
issued: 2026-05-06T02:30:32.726698
modified: 2026-05-06T02:30:32.715818
access URL: https://hal.science/hal-00957283

test_moissonnage_selune
type: Agent