Muller C-element based Decoder (MCD): A decoder against transient faults
type: Dataset
description: International audience
issued: 2026-05-06T03:27:38.371980
language: en
modified: 2026-05-06T03:27:38.371986
contact point: Organization
  fn: CCSD
keyword: cdmr
keyword: circuit-faults
keyword: coded-dual-modular-redundancy
keyword: computer-architecture
keyword: conference-papers
keyword: contemporary-logic-systems
keyword: decoding
keyword: decoding-process
keyword: digital-error-correction-method
keyword: fault-masking
keyword: fault-tolerance
keyword: fault-tolerant-model
keyword: gallager-bit-flipping-method
keyword: infoeu-reposemanticsconferenceobject
keyword: internal-upsets
keyword: iterative-decoding
keyword: logic-circuits
keyword: logic-gates
keyword: low-redundancy-error-resilience
keyword: mcd-architecture
keyword: muller-c-element-based-decoder
keyword: muller-c-element-decoding
keyword: nanoeletronic-architectures
keyword: parity-check-codes
keyword: robustness
keyword: short-length-ldpc-code
keyword: short-length-low-density-parity-check-code
keyword: spitronengineering-sciences-physicselectronics
keyword: transient-faults
keyword: xor-gates
landing page: Circuits and Systems (ISCAS), 2013 IEEE International Symposium on

Muller C-element based Decoder (MCD): A decoder against transient faults
type: Distribution
format: HTML
issued: 2026-05-06T03:27:38.398393
modified: 2026-05-06T03:27:38.324935
access URL: https://hal.science/hal-00955725

test_moissonnage_selune
type: Agent