Estimation of the electron beam-induced specimen heating and the emitted X-rays spatial resolution by Kossel microdiffraction in a scanning electron microscope
type: Dataset
description: Lien vers la version éditeur: http://www.sciencedirect.com/science/article/pii/S0304399112000307
landing page: 0304-3991
keyword: infoeu-reposemanticsarticle
keyword: journal-articles
keyword: kossel-microdiffraction
keyword: lattice-parameter
keyword: scanning-electron-microscope
keyword: specimen-heating
keyword: spimatengineering-sciences-physicsmaterials
keyword: spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics
keyword: x-rays-spatial-resolution
issued: 2026-05-06T06:02:34.368215
modified: 2026-05-06T06:02:34.368220
language: en
contact point: Organization
  fn: CCSD

test_moissonnage_selune
type: Agent

Estimation of the electron beam-induced specimen heating and the emitted X-rays spatial resolution by Kossel microdiffraction in a scanning electron microscope
type: Distribution
format: HTML
access URL: https://hal.science/hal-00951877
issued: 2026-05-06T06:02:34.373910
modified: 2026-05-06T06:02:34.357371