Strain measurement in helium implanted polycristal using image analysis in laue Micro X-ray diffraction patterns
type: Distribution
access URL: https://enpc.hal.science/hal-00951483
format: HTML
issued: 2026-05-06T06:16:47.038719
modified: 2026-05-06T06:16:47.032348

test_moissonnage_selune
type: Agent

Strain measurement in helium implanted polycristal using image analysis in laue Micro X-ray diffraction patterns
type: Dataset
contact point: Organization
  fn: CCSD
keyword: spimecamemaengineering-sciences-physicsmechanics-physicsmed-phmechanics-of-materials-phy
keyword: conference-papers
keyword: infoeu-reposemanticsconferenceobject
landing page: PhotoMechanics 2013, 27 - 29 May 2013, Montpellier University, France
description: International audience
issued: 2026-05-06T06:16:47.036976
language: en
modified: 2026-05-06T06:16:47.036980