EPC Class 1 GEN 2 UHF RFID tag emulator for robustness evaluation and improvement
type: Dataset
description: International audience
keyword: conference-papers
keyword: fault-injection
keyword: ieee
keyword: infoeu-reposemanticsconferenceobject
keyword: rfid
keyword: robustness-evaluation
keyword: spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics
issued: 2026-05-06T07:16:24.749200
modified: 2026-05-06T07:16:24.749205
language: en
contact point: Organization
  fn: CCSD

test_moissonnage_selune
type: Agent

EPC Class 1 GEN 2 UHF RFID tag emulator for robustness evaluation and improvement
type: Distribution
format: HTML
access URL: https://hal.science/hal-00950128
issued: 2026-05-06T07:16:24.762932
modified: 2026-05-06T07:16:24.739192