@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00938358v1> a dcat:Dataset ;
    dct:description "International audience" ;
    dct:identifier "hal-00938358" ;
    dct:issued "2026-05-07T05:06:29.230624"^^xsd:dateTime ;
    dct:language "en" ;
    dct:modified "2026-05-07T05:06:29.230630"^^xsd:dateTime ;
    dct:publisher <https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> ;
    dct:title "Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits" ;
    dcat:contactPoint [ a vcard:Organization ;
            vcard:fn "CCSD" ] ;
    dcat:distribution <https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00938358v1/resource/35aa0f26-d300-4870-b1a2-3635ebb9d381> ;
    dcat:keyword "accelerated-aging",
        "conducted-emission",
        "icem-modeling",
        "infoeu-reposemanticsarticle",
        "integrated-circuits",
        "journal-articles",
        "power-integrity",
        "spitronengineering-sciences-physicselectronics" ;
    dcat:landingPage <ISSN:%201546-1998> .

<ISSN:%201546-1998> a foaf:Document .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00938358v1/resource/35aa0f26-d300-4870-b1a2-3635ebb9d381> a dcat:Distribution ;
    dct:format "HTML" ;
    dct:issued "2026-05-07T05:06:29.237407"^^xsd:dateTime ;
    dct:modified "2026-05-07T05:06:29.219145"^^xsd:dateTime ;
    dct:title "Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits" ;
    dcat:accessURL <https://hal.science/hal-00938358> .

<https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> a foaf:Agent ;
    foaf:name "test_moissonnage_selune" .