Characterization of Changes in LDO Susceptibility after Electrical Stress
type: Dataset
description: International audience
issued: 2026-05-07T05:27:02.750696
language: en
modified: 2026-05-07T05:27:02.750702
contact point: Organization
  fn: CCSD
keyword: aging
keyword: emc
keyword: emi
keyword: infoeu-reposemanticsarticle
keyword: journal-articles
keyword: ldo-voltage-regulator
keyword: spitronengineering-sciences-physicselectronics
keyword: susceptibility
landing page: 0018-9375

Characterization of Changes in LDO Susceptibility after Electrical Stress
type: Distribution
format: HTML
issued: 2026-05-07T05:27:02.753324
modified: 2026-05-07T05:27:02.737889
access URL: https://hal.science/hal-00937780

test_moissonnage_selune
type: Agent