Prediction of Long-Term Immunity of a Phase-Locked Loop
type: Dataset
description: International audience
landing page: 0923-8174
keyword: circuit-aging
keyword: immunity-modelling
keyword: infoeu-reposemanticsarticle
keyword: integrated-circuits
keyword: journal-articles
keyword: reliability
keyword: spitronengineering-sciences-physicselectronics
keyword: susceptibiity-to-electromagnetic-interferences
issued: 2026-05-07T06:34:57.094707
modified: 2026-05-07T06:34:57.094712
language: en
contact point: Organization
  fn: CCSD

test_moissonnage_selune
type: Agent

Prediction of Long-Term Immunity of a Phase-Locked Loop
type: Distribution
format: HTML
access URL: https://hal.science/hal-00936086
issued: 2026-05-07T06:34:57.097925
modified: 2026-05-07T06:34:57.081035