Tradeoff exploration between reliability, power consumption, and execution time for embedded systems
type: Dataset
description: International audience
issued: 2026-05-07T15:47:41.631715
language: en
modified: 2026-05-07T15:47:41.631720
contact point: Organization
  fn: CCSD
keyword: acm-b-hardwareb8-performance-and-reliabilityb81-reliability-testing-and-fault-tolerance
keyword: acm-c-computer-systems-organizationc3-special-purpose-and-application-based-systemsc32-rea
keyword: acm-c-computer-systems-organizationc4-performance-of-systemsc45-reliability-availability
keyword: dvfs
keyword: embedded-systems
keyword: infoeu-reposemanticsarticle
keyword: infoinfo-escomputer-science-csembedded-systems
keyword: journal-articles
keyword: multicriteria-optimization
keyword: multiprocessor-scheduling
keyword: pareto-front
keyword: power-consumption
keyword: reliability
landing page: 1433-2779

Tradeoff exploration between reliability, power consumption, and execution time for embedded systems
type: Distribution
format: HTML
issued: 2026-05-07T15:47:41.634141
modified: 2026-05-07T15:47:41.619250
access URL: https://inria.hal.science/hal-00923926

test_moissonnage_selune
type: Agent