Tradeoff exploration between reliability, power consumption, and execution time for embedded systems
type: Dataset
contact point: Organization
  fn: CCSD
keyword: dvfs
keyword: power-consumption
keyword: infoinfo-escomputer-science-csembedded-systems
keyword: embedded-systems
keyword: journal-articles
keyword: acm-b-hardwareb8-performance-and-reliabilityb81-reliability-testing-and-fault-tolerance
keyword: reliability
keyword: multiprocessor-scheduling
keyword: pareto-front
keyword: acm-c-computer-systems-organizationc3-special-purpose-and-application-based-systemsc32-rea
keyword: acm-c-computer-systems-organizationc4-performance-of-systemsc45-reliability-availability
keyword: infoeu-reposemanticsarticle
keyword: multicriteria-optimization
landing page: 1433-2779
description: International audience
issued: 2026-05-07T15:47:41.631715
language: en
modified: 2026-05-07T15:47:41.631720

test_moissonnage_selune
type: Agent

Tradeoff exploration between reliability, power consumption, and execution time for embedded systems
type: Distribution
access URL: https://inria.hal.science/hal-00923926
format: HTML
issued: 2026-05-07T15:47:41.634141
modified: 2026-05-07T15:47:41.619250