@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00918177v1> a dcat:Dataset ;
    dct:description "International audience" ;
    dct:identifier "hal-00918177" ;
    dct:issued "2026-05-07T19:56:10.149899"^^xsd:dateTime ;
    dct:language "en" ;
    dct:modified "2026-05-07T19:56:10.149903"^^xsd:dateTime ;
    dct:publisher <https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> ;
    dct:title "Characterizations of InAlN/AlN/GaN Transistors for S-Band Applications" ;
    dcat:contactPoint [ a vcard:Organization ;
            vcard:fn "CCSD" ] ;
    dcat:distribution <https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00918177v1/resource/88d62d96-12bb-439a-ab44-449bc0bb2095> ;
    dcat:keyword "breakdown-voltage",
        "conference-papers",
        "hemt",
        "i-v-measurements",
        "inalnalngan",
        "infoeu-reposemanticsconferenceobject",
        "spitronengineering-sciences-physicselectronics" ;
    dcat:landingPage <Proceedings%20of%20the%206th%20EuMIC%202011> .

<Proceedings%20of%20the%206th%20EuMIC%202011> a foaf:Document .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00918177v1/resource/88d62d96-12bb-439a-ab44-449bc0bb2095> a dcat:Distribution ;
    dct:format "HTML" ;
    dct:issued "2026-05-07T19:56:10.151512"^^xsd:dateTime ;
    dct:modified "2026-05-07T19:56:10.141388"^^xsd:dateTime ;
    dct:title "Characterizations of InAlN/AlN/GaN Transistors for S-Band Applications" ;
    dcat:accessURL <https://unilim.hal.science/hal-00918177> .

<https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> a foaf:Agent ;
    foaf:name "test_moissonnage_selune" .