@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00907447v1> a dcat:Dataset ;
    dct:description "International audience" ;
    dct:identifier "hal-00907447" ;
    dct:issued "2026-05-08T03:53:48.206799"^^xsd:dateTime ;
    dct:language "en" ;
    dct:modified "2026-05-08T03:53:48.206803"^^xsd:dateTime ;
    dct:publisher <https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> ;
    dct:title "Diagnostic Tools For Accurate Reliability Investigations of GaN Devices" ;
    dcat:contactPoint [ a vcard:Organization ;
            vcard:fn "CCSD" ] ;
    dcat:distribution <https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00907447v1/resource/b3f8dcdb-0c62-4e18-b24b-c4bfba8d16c8> ;
    dcat:keyword "conference-papers",
        "gan-hemt-devices",
        "i-dlts-and-lag-measurements",
        "infoeu-reposemanticsconferenceobject",
        "low-frequency-noise",
        "reliability",
        "spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics" ;
    dcat:landingPage <21st%20International%20Conference%20on%20Noise%20and%20Fluctuations%20%28ICNF%202011%29%20by%20Institute%20of%20Electrical%20and%20Electronics%20Engineers%20%28%20IEEE%20%29> .

<21st%20International%20Conference%20on%20Noise%20and%20Fluctuations%20%28ICNF%202011%29%20by%20Institute%20of%20Electrical%20and%20Electronics%20Engineers%20%28%20IEEE%20%29> a foaf:Document .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00907447v1/resource/b3f8dcdb-0c62-4e18-b24b-c4bfba8d16c8> a dcat:Distribution ;
    dct:format "HTML" ;
    dct:issued "2026-05-08T03:53:48.215114"^^xsd:dateTime ;
    dct:modified "2026-05-08T03:53:48.198241"^^xsd:dateTime ;
    dct:title "Diagnostic Tools For Accurate Reliability Investigations of GaN Devices" ;
    dcat:accessURL <https://hal.science/hal-00907447> .

<https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> a foaf:Agent ;
    foaf:name "test_moissonnage_selune" .