Study of temperature and radiation induced microstructural changes in Xe-implanted UO2 by TEM, STEM, SIMS and positron spectroscopy
type: Dataset
description: International audience
landing page: 0022-3115
keyword: infoeu-reposemanticsarticle
keyword: journal-articles
keyword: physcondcm-msphysics-physicscondensed-matter-cond-matmaterials-science-cond-matmtrl-sci
keyword: positron-spectroscopy
keyword: sims
keyword: uranium-dioxide
keyword: xenon
issued: 2026-05-09T02:45:41.232355
modified: 2026-05-09T02:45:41.232359
language: en
contact point: Organization
  fn: CCSD

test_moissonnage_selune
type: Agent

Study of temperature and radiation induced microstructural changes in Xe-implanted UO2 by TEM, STEM, SIMS and positron spectroscopy
type: Distribution
format: HTML
access URL: https://minesparis-psl.hal.science/hal-00881212
issued: 2026-05-09T02:45:41.244441
modified: 2026-05-09T02:45:41.221959