test_moissonnage_selune
type: Agent

Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology
type: Dataset
contact point: Organization
  fn: CCSD
keyword: journal-articles
keyword: infoeu-reposemanticsarticle
keyword: nbti
keyword: laser
keyword: set
keyword: physphysphys-opticsphysics-physicsphysics-physicsoptics-physicsoptics
keyword: spitronengineering-sciences-physicselectronics
landing page: 0018-9499
description: International audience
issued: 2026-05-09T03:16:16.908334
language: en
modified: 2026-05-09T03:16:16.908339

Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology
type: Distribution
access URL: https://hal.science/hal-00880480
format: HTML
issued: 2026-05-09T03:16:16.910542
modified: 2026-05-09T03:16:16.899955