@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00880459v1> a dcat:Dataset ;
    dct:description "International audience" ;
    dct:identifier "hal-00880459" ;
    dct:issued "2026-05-09T03:16:51.513474"^^xsd:dateTime ;
    dct:language "en" ;
    dct:modified "2026-05-09T03:16:51.513479"^^xsd:dateTime ;
    dct:publisher <https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> ;
    dct:title "Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell" ;
    dcat:contactPoint [ a vcard:Organization ;
            vcard:fn "CCSD" ] ;
    dcat:distribution <https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00880459v1/resource/26db3fd1-2b23-41d5-b3e4-c8380eb000ab> ;
    dcat:keyword "infoeu-reposemanticsarticle",
        "journal-articles",
        "laser",
        "nbti",
        "physphysphys-opticsphysics-physicsphysics-physicsoptics-physicsoptics",
        "see",
        "spitronengineering-sciences-physicselectronics" ;
    dcat:landingPage <ISSN:%200026-2714> .

<ISSN:%200026-2714> a foaf:Document .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00880459v1/resource/26db3fd1-2b23-41d5-b3e4-c8380eb000ab> a dcat:Distribution ;
    dct:format "HTML" ;
    dct:issued "2026-05-09T03:16:51.515840"^^xsd:dateTime ;
    dct:modified "2026-05-09T03:16:51.505721"^^xsd:dateTime ;
    dct:title "Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell" ;
    dcat:accessURL <https://hal.science/hal-00880459> .

<https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> a foaf:Agent ;
    foaf:name "test_moissonnage_selune" .

