test_moissonnage_selune
type: Agent

An asperity-based finite element model for electrical contact of microswitches
type: Dataset
contact point: Organization
  fn: CCSD
keyword: spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics
keyword: asperity-based
keyword: microswitch
keyword: electrical-contact-resistance
keyword: infoeu-reposemanticsconferenceobject
keyword: finite-element-model
keyword: conference-papers
landing page: IEEE Holm Conference on electrical contact
description: International audience
issued: 2026-05-09T05:07:50.935101
language: en
modified: 2026-05-09T05:07:50.935106

An asperity-based finite element model for electrical contact of microswitches
type: Distribution
access URL: https://hal.science/hal-00878264
format: HTML
issued: 2026-05-09T05:07:50.950260
modified: 2026-05-09T05:07:50.926637