test_moissonnage_selune
type: Agent

Comparison between ultrathin films of YSZ deposited at the solid oxide fuel cell cathode/electrolyte interface by atomic layer deposition, dip-coating or sputtering
type: Dataset
contact point: Organization
  fn: CCSD
keyword: infoeu-reposemanticsarticle
keyword: sofc
keyword: spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics
keyword: electrical-properties
keyword: chimmatechemical-sciencesmaterial-chemistry
keyword: spimecamsmecaengineering-sciences-physicsmechanics-physicsmed-phmaterials-and-structures
keyword: yttriadoped-zirconia-ysz
keyword: impedance-spectroscopy
keyword: journal-articles
keyword: thin-layers
keyword: lanthanum-strontium-manganite-lsm
keyword: physmecamsmecaphysics-physicsmechanics-physicsmaterials-and-structures-in-mechanics-physi
landing page: 1876-973X
description: International audience
issued: 2026-05-09T17:16:49.471063
language: en
modified: 2026-05-09T17:16:49.471067

Comparison between ultrathin films of YSZ deposited at the solid oxide fuel cell cathode/electrolyte interface by atomic layer deposition, dip-coating or sputtering
type: Distribution
access URL: https://hal.science/hal-00862988
format: HTML
issued: 2026-05-09T17:16:49.473341
modified: 2026-05-09T17:16:49.458320