An efficient BER-Based Reliability Method For SRAM-based FPGA
type: Dataset
description: International audience
issued: 2026-05-10T00:03:57.250744
language: en
modified: 2026-05-10T00:03:57.250748
contact point: Organization
  fn: CCSD
keyword: checkpoint
keyword: conference-papers
keyword: fault-tolerance
keyword: infoeu-reposemanticsconferenceobject
keyword: infoinfo-escomputer-science-csembedded-systems
keyword: partial-dynamic-reconfiguration
keyword: readback
keyword: recovery
keyword: sram-based-fpgas
landing page: 7th IEEE International Design and Test Symposium IDT'2012

An efficient BER-Based Reliability Method For SRAM-based FPGA
type: Distribution
format: HTML
issued: 2026-05-10T00:03:57.252400
modified: 2026-05-10T00:03:57.237342
access URL: https://hal.science/hal-00854818

test_moissonnage_selune
type: Agent