Hot topic session 4A: Reliability analysis of complex digital systems
type: Dataset
description: ISBN 978-1-4673-5542-1
issued: 2026-05-10T10:08:37.801040
language: en
modified: 2026-05-10T10:08:37.801045
contact point: Organization
  fn: CCSD
keyword: complex-digital-circuit
keyword: conference-papers
keyword: digital-systems
keyword: infoeu-reposemanticsconferenceobject
keyword: pacs-8542
keyword: spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics
landing page: Proc. of IEEE 31st VLSI Test Symposium (VTS'13)

Hot topic session 4A: Reliability analysis of complex digital systems
type: Distribution
format: HTML
issued: 2026-05-10T10:08:37.809108
modified: 2026-05-10T10:08:37.793607
access URL: https://hal.science/hal-00842825

test_moissonnage_selune
type: Agent