Porosity evaluation of PoSi wafer using a nondestructive ultrasonic technic
type: Dataset
description: International audience
issued: 2026-05-11T14:25:44.961486
language: en
modified: 2026-05-11T14:25:44.961491
contact point: Organization
  fn: CCSD
keyword: conference-papers
keyword: infoeu-reposemanticsconferenceobject
keyword: nondestructive-testing
keyword: porous-silicon
keyword: spiacouengineering-sciences-physicsacoustics-physicsclass-ph
keyword: ultrasound
landing page: Acoustics 2012 Nantes

Porosity evaluation of PoSi wafer using a nondestructive ultrasonic technic
type: Distribution
format: HTML
issued: 2026-05-11T14:25:44.964108
modified: 2026-05-11T14:25:44.949759
access URL: https://hal.science/hal-00810963

test_moissonnage_selune
type: Agent