Study of rough surface to decrease reverberation noise in ultrasonic imaging
type: Dataset
description: Rough back surface is investigated to decrease the reverberation noise in ultrasonic imaging. Silicon crystal is selected as the backing substrate of the ultrasonic transducer because rough structure is convenient to be fabricated on silicon substrate using microfabrication technologies. Different dimensions of rough boundaries are designed and simulated to scatter the undesired waves based on finite element method modeling. Transient analysis indicates that a rough surface whose dimension (including depth and width) is around 1.0 λ should be considered to scatter a majority of incident waves.
issued: 2026-05-12T05:49:42.210071
language: en
modified: 2026-05-12T05:49:42.210077
contact point: Organization
  fn: CCSD
keyword: conference-papers
keyword: infoeu-reposemanticsconferenceobject
keyword: reflection
keyword: reflectivity
keyword: rough-surfaces
keyword: silicon
keyword: spiengineering-sciences-physics
keyword: surface-roughness
keyword: surface-waves
keyword: ultrasonic-imaging
landing page: 10th IEEE International New Circuits and Systems Conference, NEWCAS 2012

Study of rough surface to decrease reverberation noise in ultrasonic imaging
type: Distribution
format: HTML
issued: 2026-05-12T05:49:42.241727
modified: 2026-05-12T05:49:42.194102
access URL: https://hal.science/hal-00803090

test_moissonnage_selune
type: Agent