Extrinsic base resistance optimization in DPSA-SEG SiGe:C HBTs
type: Dataset
description: International audience
issued: 2026-05-12T15:25:56.329178
language: en
modified: 2026-05-12T15:25:56.329183
contact point: Organization
  fn: CCSD
keyword: annealing
keyword: boron
keyword: conference-papers
keyword: epitaxial-growth
keyword: heterojunction-bipolar-transistors
keyword: infoeu-reposemanticsconferenceobject
keyword: junctions
keyword: logic-gates
keyword: resistance
keyword: spiengineering-sciences-physics
landing page: BiCMOS Circuits and Technology Meeting, BCTM 2012

Extrinsic base resistance optimization in DPSA-SEG SiGe:C HBTs
type: Distribution
format: HTML
issued: 2026-05-12T15:25:56.356576
modified: 2026-05-12T15:25:56.280181
access URL: https://hal.science/hal-00801192

test_moissonnage_selune
type: Agent