@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

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    dct:language "en" ;
    dct:modified "2026-05-12T16:07:39.026147"^^xsd:dateTime ;
    dct:publisher <https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> ;
    dct:title "RF noise investigation in high-k/metal gate 28-nm CMOS transistors" ;
    dcat:contactPoint [ a vcard:Organization ;
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    dcat:landingPage <Proceedings%20of%2060th%20IEEE%20MTT-S%20International%20Microwave%20Symposium%2C%20IMS%202012> .

<Proceedings%20of%2060th%20IEEE%20MTT-S%20International%20Microwave%20Symposium%2C%20IMS%202012> a foaf:Document .

<https://rec.harvest-normandie.data4citizen.com/dataset/oai-hal-hal-00801049v1/resource/68a1ca6b-ef72-4a27-8352-325f12e3220e> a dcat:Distribution ;
    dct:format "HTML" ;
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    dct:modified "2026-05-12T16:07:39.017103"^^xsd:dateTime ;
    dct:title "RF noise investigation in high-k/metal gate 28-nm CMOS transistors" ;
    dcat:accessURL <https://hal.science/hal-00801049> .

<https://rec.harvest-normandie.data4citizen.com/organization/cce9db95-46d9-4dc2-84b6-764215d0a002> a foaf:Agent ;
    foaf:name "test_moissonnage_selune" .