THz emission induced by sub-threshold instability optical excited in nanometer-length field-effect transistors
type: Dataset
landing page: 20th European Workshop on Heterostructure Technology, HeTech 2011
keyword: conference-papers
keyword: infoeu-reposemanticsconferenceobject
keyword: physphysics-physics
issued: 2026-05-12T21:50:43.610837
modified: 2026-05-12T21:50:43.610844
language: en
contact point: Organization
  fn: CCSD

test_moissonnage_selune
type: Agent

THz emission induced by sub-threshold instability optical excited in nanometer-length field-effect transistors
type: Distribution
format: HTML
access URL: https://hal.science/hal-00799965
issued: 2026-05-12T21:50:43.662336
modified: 2026-05-12T21:50:43.596361