Toward fast calibration of global drift in scanning electron microscopes with respect to time and magnification.
type: Dataset
description: International audience
issued: 2026-05-13T03:11:55.235241
language: en
modified: 2026-05-13T03:11:55.235246
contact point: Organization
  fn: CCSD
keyword: calibration
keyword: drift
keyword: infoeu-reposemanticsarticle
keyword: journal-articles
keyword: principal-differential-analysis
keyword: scanning-electron-microscope
keyword: spinanoengineering-sciences-physicsmicro-and-nanotechnologiesmicroelectronics
landing page: 1559-9612

Toward fast calibration of global drift in scanning electron microscopes with respect to time and magnification.
type: Distribution
format: HTML
issued: 2026-05-13T03:11:55.241952
modified: 2026-05-13T03:11:55.189427
access URL: https://hal.science/hal-00799099

test_moissonnage_selune
type: Agent