Numerical and experimental investigation of kerf depth effect on high-frequency phased array transducer
type: Dataset
description: BackgroundHigh-frequency ultrasonic transducer arrays are essential for high resolution imaging in clinical analysis and Non-Destructive Evaluation (NDE). However, the structure design and fabrication of the kerfed ultrasonic array is quite challenging when very high frequency (⩾100 MHz) is required.Objective and methodHere we investigate the effect of kerf depth on the performances of array transducers. A finite element tool, COMSOL, is employed to simulate the properties of acoustic field and to calculate the electrical properties of the arrays, including crosstalk effect and electrical impedance. Furthermore, Inductively Coupled Plasma (ICP) deep etching process is used to etch 36°/Y-cut lithium niobate (LiNbO3) crystals and the limitation of etching aspect ratio is studied. Several arrays with different profiles are realized under optimized processes. At last, arrays with a pitch of 25 μm and 40 μm are fabricated and characterized by a network analyzer.ResultsKerf depth plays an important role in the performance of the transducer array. The crosstalk is proportional to kerf depth. When kerf depth is more than 13 μm, the array with crosstalk less than −20 dB, which is acceptable for the real application, could provide a desired resolution. Compared to beam focusing, kerf depth exhibits more effect on the beam steering/focusing. The lateral pressure distribution is quantitatively summarized for four types of arrays with different kerf depth. The results of half-cut array are similar to those of the full-cut one in both cases of focusing and steering/focusing. The Full-Width-at-Half-Maximum (FWHM) is 55 μm for the half-cut array, and is 42 μm for the full-cut one. The 5-μm-cut array, suffering from severe undesired lobes, demonstrates similar behaviors with the no-cut one. ICP process is used to etch the 36°/Y-cut LiNbO3 film. The aspect ratio of etching profile increases with the kerf width decreasing till it stops by forming a V-shaped groove, and the positive ta…
issued: 2026-05-14T09:17:32.594784
language: en
modified: 2026-05-14T09:17:32.594790
contact point: Organization
  fn: CCSD
keyword: high-frequency
keyword: infoeu-reposemanticsarticle
keyword: journal-articles
keyword: linear-arrays
keyword: micromachining
keyword: single-crystal-lithium-niobate-linbo3
keyword: spiengineering-sciences-physics
landing page: 0041-624X

Numerical and experimental investigation of kerf depth effect on high-frequency phased array transducer
type: Distribution
format: HTML
issued: 2026-05-14T09:17:32.599325
modified: 2026-05-14T09:17:32.577653
access URL: https://hal.science/hal-00790373

test_moissonnage_selune
type: Agent